| SKA天线副反射面缝隙影响分析 |
| |
| 引用本文： | 伍 洋,解 磊,杜 彪,杨文宁,刘国玺.SKA天线副反射面缝隙影响分析[J].太赫兹科学与电子信息学报,2019,17(5):850-853. |
| |
| 作者姓名： | 伍 洋 解 磊 杜 彪 杨文宁 刘国玺 |
| |
| 作者单位： | 1.The 54th Research Institute of China Electronics Technology Group Corporation，Shijiazhuang Hebei 050081，China；2.Joint Laboratory for Radio Astronomy Technology，Beijing 100012，China,The 54th Research Institute of China Electronics Technology Group Corporation，Shijiazhuang Hebei 050081，China,1.The 54th Research Institute of China Electronics Technology Group Corporation，Shijiazhuang Hebei 050081，China；2.Joint Laboratory for Radio Astronomy Technology，Beijing 100012，China,The 54th Research Institute of China Electronics Technology Group Corporation，Shijiazhuang Hebei 050081，China and 1.The 54th Research Institute of China Electronics Technology Group Corporation，Shijiazhuang Hebei 050081，China；2.Joint Laboratory for Radio Astronomy Technology，Beijing 100012，China |
| |
| 基金项目： | 国家高技术研究发展计划基金资助项目(2014AA123601)；政府间科技基金合作项目(2016YFE0100100) |
| |
| 摘 要： | 面板缝隙会引起天线增益的下降和噪声温度的提高，对追求极致灵敏度的射电望远镜而言，其影响不可忽略。针对国际大科学工程平方公里阵(SKA)的核心设备——15 m双偏置格里高利天线，结合具体的结构设计和制造工艺，对副反射面缝隙的影响进行分析。通过电磁分析指导结构设计，有效抑制了面板缝隙对天线灵敏度的影响，保证了SKA天线的性能。
|
| 关 键 词： | 射电望远镜 平方公里阵 面板缝隙 噪声温度 |
| 收稿时间： | 2017/12/5 0:00:00 |
| 修稿时间： | 2018/2/5 0:00:00 |
Investigation on the effects of the panel gaps of the SKA dish sub-reflector |
| |
| WU Yang,XIE Lei,DU Biao,YANG Wenning and LIU Guoxi.Investigation on the effects of the panel gaps of the SKA dish sub-reflector[J].Journal of Terahertz Science and Electronic Information Technology,2019,17(5):850-853. |
| |
| Authors: | WU Yang XIE Lei DU Biao YANG Wenning and LIU Guoxi |
| |
| Abstract: | Leakage through the panel gaps of the dish leads to gain loss and noise temperature increment. For the radio telescope antenna, which peruses ultra-high sensitivity, this effect cannot be ignored. This paper investigates the leakage and resulting noise temperature variance of the Square Kilometre Array(SKA) dish sub-reflector, in conjugated with the structure design and manufacture procedure of the panels. By electromagnetic analysis, the effect of the leakage due to various panel designs is evaluated, and the structure design of the sub-reflector panel is decided, fulfilling the requirement of SKA. |
| |
| Keywords: | |
|
| 点击此处可从《太赫兹科学与电子信息学报》浏览原始摘要信息 |
|
点击此处可从《太赫兹科学与电子信息学报》下载全文 |
