A correction method of color projection fringes in 3D contour measurement |
| |
Authors: | SONG Li-mei LI Zong-yan CHEN Chang-man XI Jiang-tao GUO Qing-hua and LI Xiao-jie |
| |
Affiliation: | 1. Key Laboratory of Advanced Electrical Engineering and Energy Technology, Tianjin Polytechnic University, Tianjin, 300387, China 2. Department of Electricity Examination, Patent Examination Cooperation Tianjin Center of the Patent Office, State Intellectual Property Office, Tianjin, 300304, China 3. School of Electrical, Computer and Telecommunications Engineering, University of Wollongong, Keiraville, 2500, Australia
|
| |
Abstract: | In the three-dimensional (3D) contour measurement, the phase shift profilometry (PSP) method is the most widely used one. However, the measurement speed of PSP is very low because of the multiple projections. In order to improve the measurement speed, color grating stripes are used for measurement in this paper. During the measurement, only one color sinusoidal fringe is projected on the measured object. Therefore, the measurement speed is greatly improved. Since there is coupling or interference phenomenon between the adjacent color grating stripes, a color correction method is used to improve the measurement results. A method for correcting nonlinear error of measurement system is proposed in this paper, and the sinusoidal property of acquired image after correction is better than that before correction. Experimental results show that with these correction methods, the measurement errors can be reduced. Therefore, it can support a good foundation for the high-precision 3D reconstruction. |
| |
Keywords: | |
本文献已被 SpringerLink 等数据库收录! |
| 点击此处可从《光电子快报》浏览原始摘要信息 |
|
点击此处可从《光电子快报》下载全文 |
|