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Shape measurement by carrier modulation in electronic speckle pattern interferometry |
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| Authors: | Ping Sun Zhen-xian Huang and Fei Liu |
| Affiliation: | College of Physics and Electronics, Shandong Normal University, Jinan 250014,china |
| Abstract: | A shape measurement based on ESPI by using carder is presented.When the tested object is tilted with a small angle,the carrier pattern containing altitude information is formed on the object surface.By using the carrier pattern captured by a CCD camera,the phase of the object can be derived by Fourier transform and the shape measurement is realized.The principle of the method is introduced and proved by an experiment. |
| Keywords: | speckle pattern interferometry electronic modulation carrier measurement principle method introduced experiment phase derived Fourier transform CCD camera containing altitude information surface object small angle |
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