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Microcrystalline Structure and Luminescence of ZnS Thin Films
作者姓名:WANGYu-jiang  LIURui-tang
作者单位:[1]DepartmentofPhysics,XiamenUniversity,Xiamen361005,CHN [2]DepartmentofPhysics,XiamenUniversity,Xiamen3610
基金项目:Fujian Natural Science Fund (No.A970006)
摘    要:The electroluminescence thin films doped with erbium, fabricated by thermal evaporation with two boats, are analyzed by X-ray diffraction(XRD).The relationship between electroluminescence brightness and microstructure of the thin films is obtained.The results reveal that the large grain size in high index plane of deposited microcrystalline film has an effect on electroluminescence characteristics of the film devices.

关 键 词:场致发光  ZnS薄膜  微结构  红外线衍射  XRD
收稿时间:1999/7/21

Microcrystalline Structure and Luminescence of ZnS Thin Films
WANG Yu-jiang,LIU Rui-tang.Microcrystalline Structure and Luminescence of ZnS Thin Films[J].Semiconductor Photonics and Technology,2000,6(1):20-22.
Authors:WANG Yu-jiang  LIU Rui-tang
Abstract:The electroluminescence thin films doped with erbium, fabricated by thermal evaporation with two boats, are analyzed by X-ray diffraction (XRD). The relationship between electroluminescence brightness and microstructure of the thin films is obtained. The results reveal that the large grain size in high index plane of deposited microcrystalline film has an effect on electroluminescence characteristics of the film devices.
Keywords:Electroluminescence  Thin film  Microstructure
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