条纹投影与相位偏折测量技术研究进展

条纹投影和相位偏折测量术可用于精确地测量待测物面形，在全场光学三维轮廓测量领域具有较好的发展前景。首先，介绍了条纹投影和相位偏折测量技术的基本原理，重点是这两种技术中的相位提取技术、摄像机定标技术等关键技术。其次，对条纹投影和相位偏折测量术这两种测量方法的异同点做了对比。最后，介绍了条纹投影和相位偏折测量技术在提升测量精度和速度方面的发展。为了提升测量精度，主要有校正条纹Gamma效应、提升相位提取精度、摄像机标定精度和相位-高度/梯度标定精度等途径；为了提升测量速度，主要有提升相位提取速度、相位解包裹速度等方法。

Review of fringe-projection profilometry and phase measuring deflectometry

Fringe-projection profilometry and phase measuring deflectometry can realize high accurate measurement of three-dimensional shape, which has good development prospect in the full field three-dimensional profilometry. First, the measuring principles of fringe-projection profilometry and phase measuring deflectometry were introduced. Moreover, the technologies of phase extracting and camera calibration in fringe-projection profilometry and phase measuring deflectometry were also especially emphasized, which were key technologies. Then the similarities and differences of fringe-projection profilometry and phase measuring deflectometry were compared. What's more, the development direction and problems to be solved of enhancing the measurement accuracy and speed in fringe-projection profilometry and phase measuring deflectometry were introduced. In order to improve the measurement accuracy, main methods can be divided as follows:correcting the the Gamma effect of a digital projector and a digital camera, improving the phase extraction accuracy of the fringes, enhancing the camera calibration accuracy, phase-height/gradient calibration accuracy and other means. In order to improve the measurement speed, the phase extraction speed and the phase unwrapping speed were improved.