基于使用负性液晶的边沿场切换模式的局部残影分析

随着液晶显示技术的发展,PPI越来越高,像素尺寸越来越小,穿透率的提升是一重要问题。负性液晶相对正性液晶具有高穿透率,较好的画面画质及较低的颜色偏差等优点,使得主流显示模式IPS、FFS使用负性液晶研究逐渐增多。但由于负性液晶自身特性,其影像残留较正性液晶更为严重,特别是模组粘合附近区域的局部面残。为了改善负性液晶局部影像残留,本文研究了实际样品影像残留严重区域与轻微区域不同测量数据,如温度、共电压(Vcom)等,发现影像残留严重区域与轻微区域的公共电压出现漂移现象,分析了影响残影的因素,并提出改善方案,实测结果证明本文改善局部残影的方法是有效的。

Analysis of FFS image sticking with negative liquid crystal

With the development of liquid crystal display technology, the higher PPI is, the smaller pixel is. The improvement of transmittance is an important issue. Compared with positive liquid crystal display, negative liquid crystal display has high transmittance, good color shift and display quality, so the negative liquid crystal is used in the main liquid crystal display, such as IPS and FFS modes. Nevertheless, for the physical characteristic of negative liquid crystal itself, the image sticking (IS) is more serious than positive crystal liquid, especially the area nearby the IC bonding. In order to improve the afterimage, we measured the different data, such as the temperature and common voltage (V_com) of the serious and slight area in the sample cell, and we found that the V_com voltage has different shift in the serious and slight area. The influence factors of IS were analyzed, and improvement method was proposed and it is effective to reduce the image sticking.