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脉冲准分子激光PZT薄膜的制备
引用本文:陈逸清,郑立荣,林成鲁,邹世昌.脉冲准分子激光PZT薄膜的制备[J].中国激光,1994,21(8):631-634.
作者姓名:陈逸清  郑立荣  林成鲁  邹世昌
作者单位:中国科学院上海冶金所信息功能材料国家重点实验室
摘    要:本实验采用脉冲准分子激光沉积(PLD)法,在193nm波长,5Hz频率,4J/cm2能量密度条件下,分别在Si(100)和SiO2/Si衬底上成功地沉积Pb(Zr,Ti)O3(PZT)薄膜,并在不同的条件下对PZT薄膜进行退火处理。用XRD,RBS,ASR等方法分别测量了薄膜的结构、组份和厚度。

关 键 词:PZT,脉冲激光沉积(PLD),铁电薄膜
收稿时间:1993/12/7

Lead Zirconate Titanate Thin Films Produced by Pulsed Excimer Laser Deposition
Chen Yiqing,Zheng Lirong,Lin Chenglu,Zou Shichang.Lead Zirconate Titanate Thin Films Produced by Pulsed Excimer Laser Deposition[J].Chinese Journal of Lasers,1994,21(8):631-634.
Authors:Chen Yiqing  Zheng Lirong  Lin Chenglu  Zou Shichang
Abstract:It is a new technology to combine the laser with the thin film deposition. Lead zirconate titanate (PZT) films were successfully deposited on the Si(100) and SiO2/Si substrates by pulsed eximer laser (λ=193 nm) deposition at 5 Hz, 4 J/cm2 and then annealed by RTA at various conditions.The structure, composition and thickness of the films were measured by XRD, RBS and ASR respectively.
Keywords:PZT  pulsed laser deposition(PLD)  ferroelectric thin film  
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