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Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach |
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| Authors: | Chris Feige Jan Ten Pierick Clemens Wouters Ronald Tangelder Hans G Kerkhoff |
| Affiliation: | (1) Philips Semiconductors, Business Line Cellular, Gerstweg 2, 6534 AE Nijmegen, The Netherlands;(2) Philips Semiconductors, ASIC Service Group, Prof. Holstlaan 4, 5656 AA Eindhoven, The Netherlands;(3) University of Twente, MESA Research Institute, P.O. Box 217, 7500 AE Enschede, The Netherlands |
| Abstract: | In this paper a concept is proposed to combine a bus-transfer based test approach (AMBA) with the well-known scan-test technique. This novel approach combines the advantages of modularity and core reuse (AMBA) with the benefits of high fault coverages and short time-to-market cycles (scan). The consequences with respect to test hardware implementation and tool flow are discussed. |
| Keywords: | AMBA ATPG bus-transfer core reuse design-for-testability scan-test test protocol TIC TTM vector transfer |
| 本文献已被 SpringerLink 等数据库收录！ | |
