Analysis of mode quality factors and mode reflectivities for nanowire cavity by FDTD technique |
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Authors: | Miao-Qing Wang Yong-Zhen Huang Qin Chen Zhi-Ping Cai |
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Affiliation: | State Key Lab. on Integrated Optoelectronics, Chinese Acad. of Sci., Beijing, China; |
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Abstract: | The mode frequency and the quality factor of nanowire cavities are calculated from the intensity spectrum obtained by the finite-difference time-domain (FDTD) technique and the Pade/spl acute/ approximation. In a free-standing nanowire cavity with dielectric constant /spl epsiv/=6.0 and a length of 5 /spl mu/m, quality factors of 130, 159, and 151 are obtained for the HE/sub 11/ modes with a wavelength around 375 nm, at cavity radius of 60, 75, and 90 nm, respectively. The corresponding quality factors reduce to 78, 94, and 86 for a nanowire cavity standing on a sapphire substrate with a refractive index of 1.8. The mode quality factors are also calculated for the TE/sub 01/ and TM/sub 01/ modes, and the mode reflectivities are calculated from the mode quality factors. |
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