| 集成电路测试原理和向量生成方法分析 |
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| 引用本文： | 宋尚升.集成电路测试原理和向量生成方法分析[J].现代电子技术,2014(6):122-124,128. |
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| 作者姓名： | 宋尚升 |
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| 作者单位： | 中国空空导弹研究院,河南洛阳471009 |
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| 基金项目： | 国家星火计划重点项目（2010GA690078） |
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| 摘 要： | 测试向量生成是集成电路测试的一个重要环节。在此从集成电路基本测试原理出发,介绍了一种ATE测试向量生成方法。通过建立器件模型和测试平台,在仿真验证后,按照ATE向量格式,直接生成ATE向量。以一种实际的双向总线驱动电路74ALVC164245为例,验证了此方法的可行性,并最终得到所需的向量文本。该方法具有较好的实用性,对进一步研究测试向量生成,也有一定的参考意义。
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| 关 键 词： | 集成电路测试 自动测试设备 测试向量 向量生成 |
Analysis of IC test principle and vector generation method |
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| SONG Shang-sheng.Analysis of IC test principle and vector generation method[J].Modern Electronic Technique,2014(6):122-124,128. |
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| Authors: | SONG Shang-sheng |
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| Affiliation: | SONG Shang-sheng(China Airborne Missile Academy,Luoyang 471009,China) |
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| Abstract: | Vector generation is an important part of IC testing. According to the basic testing principle of IC,a method ofATE test vector generation is introduced,in which the device model and test bench are established and verified with simulationmeans first,and then the ATE vector is directly generated according to the ATE vector format. Taking an actual bidirectionalbus drive circuit 74ALVC164245 as an example,the feasibility of this method was verified,and the required vector text was gotfinally. This method has good practicability and certain reference significance for further study on the test vector generation. |
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| Keywords: | IC test ATE test vector vector generation |
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