保证电子设备高筛选度的一种重要途径 |
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引用本文: | 刘婷,陈晓彤,范晓华.保证电子设备高筛选度的一种重要途径[J].电子产品可靠性与环境试验,2001(6):42-45. |
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作者姓名: | 刘婷 陈晓彤 范晓华 |
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作者单位: | 航天机电集团第三研究院总体设计部,北京,100074 |
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摘 要: | 根据弹用电子设备在温度循环时内部温度变化的测定结果,论述了温度变化率对筛选度和循环次数的影响,从而阐明了在温度循环过程中提高温度变化率的作用。
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关 键 词: | 温度变化率 筛选度 温度循环 筛选 |
修稿时间: | 2001年9月13日 |
An Important Approach to Ensuring High Screening Degree of Electronic Device |
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Abstract: | According to the results of internal temperature change measurement during temperature cycling for the electronic device of missile, the influence of the temperature alteration ratio on screening degree and cycling times is discussed, and the functions of increasing temperature alteration ratio in the process of temperature cycling are expounded. |
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Keywords: | temperature alteration ratio screening degree temperature cycling screening |
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