SCR-based transient detection circuit for on-chip protection design against system-level electrical transient disturbance |
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Authors: | Ming-Dou Ker Wan-Yen Lin Cheng-Cheng Yen |
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Affiliation: | 1. Institute of Electronics, National Chiao-Tung University, 1001 University Road, Hsinchu, Taiwan;2. Department of Electronic Engineering, I-Shou University, Kaohsiung, Taiwan |
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Abstract: | A new silicon controlled rectifier (SCR)-based transient detection circuit for on-chip protection design against system-level electrical transient disturbance is proposed. The circuit function to detect positive or negative electrical transients during system-level electrostatic discharge (ESD) and electrical fast transient (EFT) tests has been verified in silicon chip. The experimental results in a 0.18-μm CMOS process have confirmed that the new proposed detection circuit can successfully memorize the occurrence of system-level electrical transient disturbance events. The detection results can be cooperated with firmware design to execute system recovery procedures, therefore the immunity of microelectronic systems against system-level ESD or EFT tests can be effectively improved. |
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