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硅纳米线纳米电子器件及其制备技术
引用本文:裴立宅,唐元洪,陈扬文,张勇,郭池.硅纳米线纳米电子器件及其制备技术[J].电子元件与材料,2004,23(10):44-47.
作者姓名:裴立宅  唐元洪  陈扬文  张勇  郭池
作者单位:湖南大学材料科学与工程学院,湖南,长沙,410082
摘    要:硅纳米线由于特殊的光学及电学性能如量子限制效应及库仑阻塞效应等,在纳米电子器件的应用方面具有潜在的发展前景。介绍了采用电子束蚀刻技术(EB)、反应性离子蚀刻技术(RIE)、金属有机物化学气相沉积(MOCVD)等制备技术及场效应晶体管、单电子探测器及存储器、双方向电子泵及双重门电路等硅纳米线纳米电子器件的最新进展情况,并对其发展前景作了展望。

关 键 词:电子技术  硅纳米线  综述  纳米电子器件  制备  性能
文章编号:1001-2028(2004)10-0044-04

Nanoelectronic Devices Fabricated Technology with Si Nanowire
PEI Li-zhai,TANG Yuan-hong,CHEN Yang-wen,ZHANG Yong,GUO Chi.Nanoelectronic Devices Fabricated Technology with Si Nanowire[J].Electronic Components & Materials,2004,23(10):44-47.
Authors:PEI Li-zhai  TANG Yuan-hong  CHEN Yang-wen  ZHANG Yong  GUO Chi
Abstract:Si nanowire is promising in application of nanoelectronic devices due to its specially optical and electronic properties such as quantum confinement effect and coulomb blockade effect. The recent developments of nanoelectronic devices such as field effect transistor(FET), single electron detector and memory cell, bi-directional electron pumps, dual-gate configuration which were fabricated with electron bind lithography(EB), reaction ion lithography(RIE), metal organic chemical vapor deposition(MOCVD) are reviewed. The developments of nanoelectronic devices with Si nanowires are also discussed in the paper.
Keywords:electronic technology  silicon nanowire  review  nanoelectronic devices  fabrication  properties
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