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基于工艺参数扰动的随机互连线时延分析
引用本文:李鑫,Janet M.Wang,唐卫清,吴慧中.基于工艺参数扰动的随机互连线时延分析[J].半导体学报,2008,29(2).
作者姓名:李鑫  Janet M.Wang  唐卫清  吴慧中
作者单位:1. 南京理工大学计算机科学与技术学院,南京,210094
2. 亚利桑那大学电子工程系,亚利桑那州,AZ8742,美国
3. 中国科学院计算技术研究所,北京,100080
摘    要:考虑工艺参数扰动对互连电路传输性能的影响,建立了基于工艺扰动的互连线随机模型.通过改进的去耦算法对随机互连线元进行去耦,结合随机伽辽金方法(SGM)和多项式混沌展开(PCE)进行互连分析,进而利用复逼近及二分法给出工艺参数扰动下互连时延的有限维表达式.仿真实验结果不仅与SPICE仿真吻合得较好,相较于SPICE蒙特卡洛仿真还具有更高的计算效率.

关 键 词:耦合互连线  工艺参数扰动  随机建模  时延估计  随机伽辽金方法  多项式混沌展开

Stochastic Analysis of Interconnect Delay in the Presence of Process Variations
Li Xin,Janet M.Wang,Tang Weiqing,Wu Huizhong.Stochastic Analysis of Interconnect Delay in the Presence of Process Variations[J].Chinese Journal of Semiconductors,2008,29(2).
Authors:Li Xin  Janet MWang  Tang Weiqing  Wu Huizhong
Abstract:Process variations can reduce the accuracy in estimation of interconnect performance.This work presents a process variation based stochastic model and proposes an effective analytical method to estimate interconnect delay.The technique decouples the stochastic interconnect segments by an improved decoupling method.Combined with a polynomial chaos expression(PCE),this paper applies the stochastic Galerkin method(SGM)to analyze the system response.A finite representation of interconnect delay is then obtained with the complex approximation method and the bisection method.Results from the analysis match well with those from SPICE.Moreover,the method shows good computational efficiency,as the running time is much less than the SPICE simulation's.
Keywords:coupled interconnects  process variations  stochastic modeling  delay estimation  stochastic Galerkin methd  polynomial chaos expression
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