辐照诱生的双极性线性稳压器的1/f 噪声退化研究

研究发现辐照能使双极线性稳压器LM117的输出1/f噪声性能退化。本文在研究双极线性稳压器LM117的辐照失效机理基础上，认为LM117的内部带隙基准是其噪声性能退化的关键部件，辐照引起的带隙基准内部的双极性晶体管的基极表面复合电流的退化，导致LM117输出1/f噪声发生退化。通过对比，可以看出1/f噪声比电参数敏感，也可以用来表征LM117辐照损伤。

Radiation-induced 1/f noise degradation of bipolar linear voltage regulator

Radiation-induced 1/f noise degradation in the LM117 bipolar linear voltage regulator is studied. Based on the radiation-induced degradation mechanism of the output voltage, it is suggested that the band-gap reference subcircuit is the critical component which leads to the 1/f noise degradation of the LM117. The radiation makes the base surface current of the bipolar junction transistors of the band-gap reference subcircuit increase, which leads to an increase in the output 1/f noise of the LM117. Compared to the output voltage, the 1/f noise parameter is more sensitive, it may be used to evaluate the radiation resistance capability of LM117.