A numerical integration-based yield estimation method for integrated circuits

A novel integration-based yield estimation method is developed for yield optimization of integrated circuits.This method tries to integrate the joint probability density function on the acceptability region directly. To achieve this goal,the simulated performance data of unknown distribution should be converted to follow a multivariate normal distribution by using Box-Cox transformation(BCT).In order to reduce the estimation variances of the model parameters of the density function,orthogonal array-based mo...