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Novel closed-form resistance formulae for rectangular interconnects |
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| Authors: | Chen Baojun Tang Zhen'an Yu Tiejun School of Electronic Science Technology Dalian University of Technology Dalian China School of Electronics Information Engineering Dalian Jiaotong University Dalian China |
| Affiliation: | Chen Baojun~(1,2, ),Tang Zhen'an~1,and Yu Tiejun 1 School of Electronic Science and Technology,Dalian University of Technology,Dalian 116023,China 2 School of Electronics and Information Engineering,Dalian Jiaotong University,Dalian 116028,China 3 Department of R&D,Sigrity Inc,Santa Clara,CA 95051,USA |
| Abstract: | Two closed-form formulae for the frequency-dependent resistance of rectangular cross-sectional interconnects are presented.The frequency-dependent resistance R(f) of a rectangular interconnect line or a interconnect line with a ground plane structure is first obtained by a numerical method.Based on the strict numerical results, a novel closed-form formula R(f) for a rectangular interconnect alone is fitted out using the Levenberg-Marquardt method.This R(f) can be widely used for analyzing on-chip power grid... |
| Keywords: | interconnect resistance Levenberg-Marquardt method |
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