石化装置安全仪表系统KooN表决结构的误跳车率定量分析

为了更准确量化安全仪表系统的误跳车率，基于联锁回路SIF中传感器、逻辑解算器、执行机构引发误跳车的不同失效机理和模型，考虑共因失效对误跳车率的影响，提出1种更符合实际并适用于异型KooN结构的新子系统误跳车率计算模型（STR of Non-identical Redundant System，SNRS）。针对SIF回路的误跳车率计算，建立了1种分析安全联锁SIF回路误跳车率（Reliability based Spurious Trip，RST）的计算框架。研究结果表明:以某聚丙烯装置第三反应器保护系统为例，将SNRS和RST方法与目前主流的多种计算方法进行数值计算对比，验证了方法的有效性，能够有效进行定量分析。

Quantitative analysis on spurious trip rate of safety instrumented system with KooN voting architectures in petrochemical plant

In order to quantify the spurious trip rate (STR) of the safety instrumented system (SIS) more accurately, based on different failure mechanism and models of spurious trip caused by the sensors, logic solvers and final executors in the interlocking circuit SIF, a new calculation model for the spurious trip rate of subsystem (STR of Non identical Redundant System, SNRS) was proposed considering the influence of common cause failure on the spurious trip rate, which was more consistent with the actual situation and suitable for the non identical KooN architectures. Aiming at the calculation of the spurious trip rate for the SIF circuit, a calculation framework for analyzing the spurious trip rate of the safety interlocking SIF circuit (Reliability based Spurious Trip, RST) from a new perspective was established. The results showed that taking the 3rd reactor protection system of a polypropylene plant as an example, the numerical calculation results of SNRS and RST methods were compared with multiple current mainstream calculation methods, and the effectiveness of the proposed methods was verified, so the quantitative analysis could be carried out effectively.