一种新的模拟电路故障诊断方法

将因元件容差和故障产生的元件参数增量及电路不可及节点电压增量作为优化变量，构造一个新的故障诊断非线性约束Ｌ１范数优化问题，并应用Ｈｏｐｆｉｅｌｄ网络原理来处理该Ｌ１范数问题，其显著特点是只需一次优化过程即能估计出最可能故障元件，计算量小，故障诊断实例和计算机模拟结果表明，所提方法是可行的。

A New Technique for Fault Isolation in Linear Analog Circuits

A new nonlinear constrained L1 norm problem is constructed by taking the increment of component values and the voltage increment at inaccessible nodes in the faulty circuit for variables to be optimized. This L1 norm problem is solved based on the principle of Hopfield neural network. Using this technique,only a single process of optimization is needed to isolate the most likely faulty elements with minimal computation. Both experimental results and computer simulation show that the proposed method is feasible.