| 集成电路测试相关标准研究与探讨 |
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| 引用本文： | 谢正光.集成电路测试相关标准研究与探讨[J].微电子学,2004,34(3):246-249,253. |
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| 作者姓名： | 谢正光 |
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| 作者单位： | 湖南怀化学院,物理系,应用物理教研室,湖南,怀化,418008 |
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| 基金项目： | 国家部委资助项目(41323020109) |
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| 摘 要： | 重点研究了纯数字信号、混合信号和片上系统测试的一些问题及相关标准，阐述了各标准的作用，分析了这些标准在实际应用中存在的一些问题及其局限性。
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| 关 键 词： | 集成电路 边界扫描 混合信号电路 片上系统 可测性设计 |
| 文章编号： | 1004-3365(2004)03-0246-04 |
A Discussion on IEEE Standards Concerning IC Test |
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| XIE Zheng-guang.A Discussion on IEEE Standards Concerning IC Test[J].Microelectronics,2004,34(3):246-249,253. |
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| Authors: | XIE Zheng-guang |
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| Abstract: | Problems in the test of all-digital signal IC's, mixed signal IC's and system-on-a-chip are investigated in detail, and a discussion is made on IEEE Standards concerning the test of these IC's. The role of each standard is elaborated, and problems encountered in the application of the standards are analyzed. Finally, their limitations are also pointed out. |
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| Keywords: | Integrated circuit Boundary scan Mixed-signal IC SOC Design for testability |
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