| 面向微纳材料的激光扫描二维成像系统 |
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| 引用本文： | 迟鹏,彭建,谷付星.面向微纳材料的激光扫描二维成像系统[J].光学仪器,2019,41(4):63-68. |
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| 作者姓名： | 迟鹏 彭建 谷付星 |
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| 作者单位： | 上海理工大学光电信息与计算机工程学院,上海,200093;上海理工大学光电信息与计算机工程学院,上海,200093;上海理工大学光电信息与计算机工程学院,上海,200093 |
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| 摘 要： | 在对微纳材料光学特性表征中,需要获得分辨率更高的波长和强度的荧光图像。普通的显微镜无法满足测试的要求,因此将普通的成像显微镜、光谱仪以及纳米移动台组成激光扫描显微镜成像系统,并利用LabVIEW开发了一套完整的集二维扫描采集与信号图像处理一体的系统上位机软件。扫描采集过程使用了低通滤波等数字信号处理方法消除光谱仪信号噪声的影响。利用本系统测量硒化镉纳米带、单层二硫化钼得到了荧光强度图像以及荧光峰值波长图像,能分辨出最小波长为0.03 nm的荧光。将采集长度与实际长度进行比较并分析荧光强度差异,取得了较好的效果。
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| 关 键 词： | 激光扫描成像 LabVIEW 光谱仪去噪 荧光峰值波长图像 荧光强度图像 |
| 收稿时间： | 2018/9/25 0:00:00 |
Laser scanning two-dimensional imaging system formicro-nano materials |
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| CHI Peng,PENG Jian and GU Fuxing.Laser scanning two-dimensional imaging system formicro-nano materials[J].Optical Instruments,2019,41(4):63-68. |
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| Authors: | CHI Peng PENG Jian and GU Fuxing |
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| Affiliation: | School of Optical-Electrical and Computer Engineering, University of Shanghai forScience and Technology, Shanghai 200093, China,School of Optical-Electrical and Computer Engineering, University of Shanghai forScience and Technology, Shanghai 200093, China and School of Optical-Electrical and Computer Engineering, University of Shanghai forScience and Technology, Shanghai 200093, China |
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| Abstract: | In the optical characterization of micro/nano materials, in order to obtain higher resolution wavelength and intensity fluorescence images, a common imaging microscope, spectrometer and nano mobile station are combined to form a laser scanning microscope imaging system. LabVIEW is used to develope a complete set of system PC software for integrating 2D scanning acquisition and signal image processing. The scanning acquisition process uses digital signal processing methods such as low-pass filtering to eliminate the effects of spectrometer signal noise. The system is used to measure the cadmium selenide nanobelts and monolayer molybdenum disulfide. The fluorescence intensity image and the fluorescence peak wavelength image are obtained. Fluorescence with a minimum wavelength of 0.03 nm can be resolved. The acquisition length is compared with the actual length and the fluorescence intensity difference is analyzed. Good results are obtained. |
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| Keywords: | Laser scanning imaging LabVIEW spectrometer denoising fluorescence peak wavelength image fluorescence intensity image |
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