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Dynamic probe of ZnTe(110) surface by scanning tunneling microscopy
Authors:Ken Kanazawa  Shoji Yoshida  Hidemi Shigekawa  Shinji Kuroda
Affiliation:Faculty of Pure and Applied Sciences, University of Tsukuba, Tsukuba 305-8573, Japan
Abstract:The reconstructed surface structure of the II–VI semiconductor ZnTe (110), which is a promising material in the research field of semiconductor spintronics, was studied by scanning tunneling microscopy/spectroscopy (STM/STS). First, the surface states formed by reconstruction by the charge transfer of dangling bond electrons from cationic Zn to anionic Te atoms, which are similar to those of IV and III–V semiconductors, were confirmed in real space. Secondly, oscillation in tunneling current between binary states, which is considered to reflect a conformational change in the topmost Zn–Te structure between the reconstructed and bulk-like ideal structures, was directly observed by STM. Third, using the technique of charge injection, a surface atomic structure was successfully fabricated, suggesting the possibility of atomic-scale manipulation of this widely applicable surface of ZnTe.
Keywords:scanning tunneling microscopy  atom manipulation  ZnTe  semiconductor surface
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