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Development of Certified Reference Materials and Methods of Calibration of Small-Angle X-Ray Diffractometers for Certification and Standardization of Articles Produced by Nanoindustry |
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| Authors: | A S Avilov A S Baturin V V Volkov Yu A D’yakova M A Ermakova A Yu Kuzin M A Marchenkova V B Mityukhlyaev A Yu Seregin S N Sul’yanov E Yu Tereshchenko P A Todua |
| Affiliation: | 2. Shubnikov Institute of Crystallography, Russian Academy of Sciences, Moscow, Russia 1. Research Center for the Study of the Properties of Surfaces and Vacuum (NITsPV), Moscow, Russia 3. Moscow Institute of Physics and Technology (MFTI), Dolgoprudnyi, Russia |
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| 本文献已被 SpringerLink 等数据库收录！ | |
