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基于混沌搜索的数字电路多故障测试生成
引用本文:徐春艳,赵津燕.基于混沌搜索的数字电路多故障测试生成[J].微计算机信息,2010(1):102-103.
作者姓名:徐春艳  赵津燕
作者单位:北华大学计算机学院,吉林132021
摘    要:针对数字电路中多故障测试生成较难的问题,本文提出了基于混沌搜索的数字电路多故障测试生成算法。该算法先把多故障转换成为单故障,再用神经网络的方法对单故障电路构造故障的约束网络,最后用混沌搜索方法求解故障约束网络能量函数的最小值点获得原电路中多故障的测试矢量。在一些国际标准电路上的实验结果表明了本算法的可行性。

关 键 词:混沌搜索  神经网络  约束网络  能量函数

A Multiple Faults Test Generation Based on Chaonic Searching for Digital Circuits
XU Chun-yan ZHAO Jin-yan.A Multiple Faults Test Generation Based on Chaonic Searching for Digital Circuits[J].Control & Automation,2010(1):102-103.
Authors:XU Chun-yan ZHAO Jin-yan
Affiliation:XU Chun-yan ZHAO Jin-yan (Computer College,Beihua University.Jilin 132021,China)
Abstract:A multiple faults test generation algorithm based on chaonic searching for digital circuits is proposed in this paper because the test generation for multiple faults in digital circuits is more difficult.This algorithm change multiple faults into single fault firstly and constructs the constraint network of the fault for the single fault circuit with method of neural networks.The test vectors for multiple faults in the original circuit can be obtained by solving the minimum of energy function of the constra...
Keywords:chaonic searching  neural networks  constraint network  energy function  
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