| X射线衍射技术在材料分析中的应用 |
| |
| 引用本文： | 田志宏,张秀华,田志广.X射线衍射技术在材料分析中的应用[J].工程与试验,2009,49(3):40-42. |
| |
| 作者姓名： | 田志宏 张秀华 田志广 |
| |
| 作者单位： | 1. 中冶建筑研究总院有限公司建筑和结构研究中心,北京,100088
2. 唐山港陆钢铁有限公司,河北,唐山,064200 |
| |
| 摘 要： | X射线衍射分析技术是一种十分有效的材料分析方法,在众多领域的研究和生产中被广泛应用。介绍了X射线衍射的基本原理,从物相鉴定、点阵参数测定、微观应力测定等几方面概述了X射线衍射技术在材料分析中的应用进展。
|
| 关 键 词： | X射线衍射技术 晶体结构 材料分析 |
Application of X-ray Diffraction Technology in Material Analysis |
| |
| Tian Zhihong,Zhang Xiuhua,Tian Zhiguang.Application of X-ray Diffraction Technology in Material Analysis[J].ENGINEERING & TEST,2009,49(3):40-42. |
| |
| Authors: | Tian Zhihong Zhang Xiuhua Tian Zhiguang |
| |
| Affiliation: | Tian Zhihong , Zhang Xiuhua , Tian Zhiguang(1. Central Research Institute of Building and Construction, China Metallurgical Group Corporation, Beijing 100088,China ; 2. Tangshan Ganglu Iron Steel Corporation Limit, Tangshan 064200, Hebei,China) |
| |
| Abstract: | X-ray diffraction analysis technology is effective for material analysis,thus it is widely used in various research and manufacture fields.This article introduced the basic principle of X-ray diffraction,and discussed the application progress of X-ray diffraction technology in material analysis,which includes phase identification,determination of lattice parameter and determination of microcosmic stress etc. |
| |
| Keywords: | X-ray diffraction technology crystal structure material analysis |
| 本文献已被 维普 万方数据 等数据库收录！ |
|
