| 标准测试存取口与边界扫描结构在印制板级与系统级实现的探讨 |
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| 引用本文： | 刘家松,任长明.标准测试存取口与边界扫描结构在印制板级与系统级实现的探讨[J].电子测量与仪器学报,1995,9(3):28-33. |
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| 作者姓名： | 刘家松 任长明 |
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| 作者单位： | 天津大学计算机系!天津300072 |
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| 摘 要： | 本文探讨中国电子行业标准“标准可测性总线”第一部分“标准测试存取口与边界扫描结构”在印制板级与系统级的实现问题。阐述了不要针床夹具借助边界扫描测试印制板上器件间互连的方法,综述了美国相应标准ＩＥＥＥ Ｓｔｄ １１４９．１公布前后提出和试行在印制板级和实验级实现的若干方法和方案,包括采用符合与不符合该标准的两种器件的混合型板和系统。初步探讨了实践中国电子行业标准“标准测试存取口与边界扫描结构”和开发
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| 关 键 词： | 可测性 集成电路 标准 标准测试存取口 边界扫描 |
Investigation on Implementation of Standard Test Access Port and Boundary Scan Architecture at Board and System Levels |
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| Liu Jiasong, Ren Changming, Liu Shirong.Investigation on Implementation of Standard Test Access Port and Boundary Scan Architecture at Board and System Levels[J].Journal of Electronic Measurement and Instrument,1995,9(3):28-33. |
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| Authors: | Liu Jiasong Ren Changming Liu Shirong |
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| Affiliation: | Tianjin University |
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| Abstract: | In the aticle, the implementation of Standard Test Access port and Boundary Scan Architecture. which is Part I of Chinese Electronic Industry Standard "Standard Testability Bus" at board and system levels is overviewed and investigated. A few propositions to implement and develop the Chinese Electronic Industry Standard"Standard Testability Bus" are given. |
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| Keywords: | Testability design Standard testability bus (T-BUS) Standard test access port and boundary scan architecture |
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