Reliability of diagnostic methods based on low-frequency noise analysis

Various methods for separating an integrated circuit (IC) batch were considered using noise parameters for the purpose of determining their reliability. The existing methods for screening semiconductor products using low-frequency (LF) noise were tested on transistors, as well as both digital and analog ICs, and showed good results. Selection criteria for semiconductor products were determined based on the statistics of a representative sample; however, their reliability was not estimated. The calculation of the correlation coefficient of determined LF noise parameters and reference reliability testing results was taken as the basis of the determination of reliability of diagnostic methods. For the experiment, KR142EN5A ICs made by bipolar technology were selected, which represent three-pin stabilizers with a fixed output voltage from 5 V and are used in many radio-electronic devices.