首页 | 官方网站   微博 | 高级检索  
     


Selective incorporation of Si along step edges during delta-doping on MOVPE-grown GaAs (001) vicinal surfaces
Authors:Junichi Motohisa  Chiharu Tazaki  Tomoki Irisawa  Masashi Akabori  Takashi Fukui
Affiliation:(1) Research Center for Interface Quantum Electronics, Hokkaido University, North 13 West 8, 060-8628 Sapporo, Japan
Abstract:We investigated the delta-doping (δ-doping) of Si using SiH4 on MOVPE-grown GaAs (001) vicinal surfaces to explore the possibility of selective incorporation of Si along atomic steps, and to demonstrate doping quantum wires by the combination of multiatomic steps and wire-like doping. It was found that the doping density on vicinal surfaces was enhanced as the misorientation angle was increased, which suggested the enhanced decomposition of SiH4 and the selective incorporation of Si at step edges. It was also found that this selective incorporation could be enhanced by annealing the surface prior to the δ-doping, which resulted from the reduced incorporation of Si at the terrace regions. Anisotropic electron transport properties which are expected from the wire-like incorporation along step edges are also discussed.
Keywords:Metal organic vapor phase epitaxy (MOVPE)  δ  -doping  GaAs vicinal substrates  multiatomic steps  step edge
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司    京ICP备09084417号-23

京公网安备 11010802026262号