| ICP—AES法测定硅石样品中多种杂质元素 |
| |
| 引用本文： | 龙纪群,杨刚,陈菊.ICP—AES法测定硅石样品中多种杂质元素[J].贵州地质,2008,25(3). |
| |
| 作者姓名： | 龙纪群 杨刚 陈菊 |
| |
| 作者单位： | 1. 中国地质大学材化学院,湖北,武汉,430071;国土资源部贵阳矿产资源监督检测中心,贵州,贵阳,550004
2. 国土资源部贵阳矿产资源监督检测中心,贵州,贵阳,550004 |
| |
| 摘 要： | 用电感耦合等离子体原子发射光谱法(ICP-AES)对地质样品硅石中多种杂质元素进行测定。方法确定了各元素的检出限,回收率在92%至105%之间,RSD小于1.93%,实验表明,该方法简便快速,具有很低的检出限和良好的精密度、准确度。
|
| 关 键 词： | 电感耦合等离子体原子发射光谱法(ICP-AES) 硅石 杂质 |
ICP-AES Determination of Multi-impurity Elements in Geologic Sample: Silica |
| |
| LONG Ji-qun,YANG Gang,CHEN Ju.ICP-AES Determination of Multi-impurity Elements in Geologic Sample: Silica[J].Guizhou Geology,2008,25(3). |
| |
| Authors: | LONG Ji-qun YANG Gang CHEN Ju |
| |
| Abstract: | Determination of multi-impurity elements in silica of geologic sample by Inductively Coupled Plasma Emission Spectrometer(ICP-AES),the method is much better than the conventional chemical method.The advantages of high efficiency and simple operation are provided.The recovery is 92%-105% for the elements with precision less than 1.93%.The result shows that the method is simple,precision and accuracy. |
| |
| Keywords: | ICP-AES multi-impurity elements silica |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
|
