基于IEEE 1500标准的IP核测试壳设计

随着集成电路规模的不断扩大,基于IP核复用的SOC设计技术被广泛应用,但是由于IP核的来源不同,设计标准的不兼容等因素,使得SOC的测试变得越来越困难。IEEE1500标准设立的目标是标准化IP核提供商与用户之间的测试接口,简化核测试信息的复用。本文在研究IEEE1500标准的硬件结构基础上,讨论了1500的测试指令集,然后以基准电路集ISCAS89中的s349时序电路为例,对其进行全扫描设计之后,详细说明了基于IEEE1500标准的IP核测试壳各部分的设计过程,最后通过仿真实验,验证了在不同测试指令和故障模式下,测试壳的有效性。

Design of IP core test wrapper based on IEEE 1500 standard

With the continuous improvements on the scale of integrated circuits,the technology of IP core-based SOC design is widely used.Because of the fact that IP cores usually come from different providers and the incompatibility of design standard,it becomes more and more difficult to test SOC.IEEE 1500 standard＇s goal is standardizing the test interface between IP core providers and core users and aims at improving ease of test reuse and test integration with respect to the core-based SOC.The background of the IEEE 1500 standard,the basic structure and the test instructions set are described in this paper firstly.Then taking s349 sequential circuit for example,we describe the design of test wrapper based on the IEEE 1500 standard for embedded IP core in detail.Finally we verify the test wrapper＇s efficiency under different test instructions through simulating experiments.