MRR 故障对二进制全光全加器的性能影响研究

针对现有的二进制全光全加器所需微环谐振器(MRR)数量较多的问题,首次提出了3个MRR串联结构的全光全加器。针对MRR对温度的波动和制程偏差非常敏感,容易产生故障,建立了MRR故障模型,设计了全光全加器(OFA)的可靠性指标平均误差距离,分析了MRR单故障模型对OFA性能的影响。插入损耗(insertion loss, IL)的实验结果表明,提出的OFA结构总体上优于现有的OFA结构;相比现有的方案,提出的OFA结构的MRR硬件开销最多减少70%,最少减少50%;平均误差距离的实验结果表明,方案1和方案2的平均误差距离较大,本文提出方案的平均误差距离适中;多位二进制全加器中,最高位在单故障模型下的,平均误差距离的绝对值均随着多位二进制全加器的位数增加而增大;最低位在单故障模型下的,平均误差距离的绝对值均随着多位二进制全加器的位数增加保持不变;实物验证和基于Modelsim平台的实验验证了MRR故障对全加器的性能影响的正确性。

Performance impact of MRR fault to binary optical full adder

Aiming at the problem of large number of micro ring resonator (MRR) required by current all-optical full adder, an optical full adder with three Cascaded MRR structures is proposed for the first time. In view of the fact that MRR is sensitive to temperature fluctuation and process variation, the MRR fault model is established. The mean error distance of reliability metric ofoptical full adder (OFA) is designed, and the influence of MRR single fault model on OFA is analyzed. Simulation results of insertion loss show that the proposed OFA architecture is superior to existing OFA architecture in general. Compared with the current scheme, the hardware overhead of the proposed OFA architecture is reduced between 50% and 70% . Experimental results show that the average error distance of scheme 1 and scheme 2 is large, while the average error distance of the proposed scheme is moderate. For the multi-bit binary full adder, the absolute value of the average error distance increases with the number of bits of the multi-bit binary full adder in the single fault model with the highest bit. For the single fault model with the lowest bit, the absolute value of the average error distance remains unchanged with the number of bits of the multi bit binary full adder. Physical verification and experiments based on Modelsim platform verify the correctness of the effect of MRR fault on the performance of full adder.