| 用探孔场发射显微镜研究单壁碳纳米管的场发射 |
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| 引用本文： | 张兆祥,张耿民,金新喜,侯士敏,赵兴钰,顾镇南,刘惟敏,薛增泉.用探孔场发射显微镜研究单壁碳纳米管的场发射[J].电子学报,2003,31(11):1623-1625. |
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| 作者姓名： | 张兆祥 张耿民 金新喜 侯士敏 赵兴钰 顾镇南 刘惟敏 薛增泉 |
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| 作者单位： | 1. 北京大学信息科学技术学院电子学系,北京 100871;2. 北京大学化学工程与分子学院,北京 100871 |
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| 基金项目： | 国家自然科学基金 (No .60 2 31 0 1 0 ,No .90 2 0 60 4 8,No .60 1 71 0 2 5)，国家重点基础研究资助项目 (No.2 0 0 1CB61 0 50 3)，教育部博士点基金 (No.2 0 0 2 0 0 0 1 0 0 3)，教育部留学回国科研启动基金 (No .60 1 2 81 0 1 ) |
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| 摘 要： | 探孔场发射显微镜可以观测样品的场发射图象,又能测量局域场发射电流和总场发射电流与电压的关系.本文利用具有二维调节探孔位置的场发射显微镜装置测量了单壁碳纳米管场发射图象不同区域、不同吸附状态和经过热处理后的I-V特性.
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| 关 键 词： | 场发射 场发射显微镜 单壁碳纳米管 |
| 文章编号： | 0372-2112(2003)11-1623-03 |
| 收稿时间： | 2002-10-29 |
Study of Field Emission from Single-Walled Carbon Nanotubes Using Probe-Hole Method |
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| ZHANG Zhao-xiang ,ZHANG Geng-min ,JIN Xin-xi ,HOU Shi-min ,ZHAO Xing-yu ,GU Zhen-nan ,LIU Wei-min ,XUE Zeng-quan.Study of Field Emission from Single-Walled Carbon Nanotubes Using Probe-Hole Method[J].Acta Electronica Sinica,2003,31(11):1623-1625. |
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| Authors: | ZHANG Zhao-xiang ZHANG Geng-min JIN Xin-xi HOU Shi-min ZHAO Xing-yu GU Zhen-nan LIU Wei-min XUE Zeng-quan |
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| Affiliation: | 1. Department of Electronics,School of Electronics Engineering and Computer Science,Peking University,Beijing 100871,China;2. College of Chemistry and Molecular Engineering,Peking University,Beijing 100871,China |
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| Abstract: | A probe-hole Field Emission Microscope (FEM) features the capability of measuring the respective dependence of local and total field emission currents on applied voltage.A FEM equipped with a probe-hole,which could be submitted to two-dimensional motion,was employed to acquire curves of field emission current versus applied voltage of single-walled carbon nanotubes (SWCNTs).The field emission currents were acquired from different regions and different adsorption states.Furthermore,the influence of heat treatment on current-voltage behaviors of the SWCNTs was also studied. |
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| Keywords: | field emission field-emission microscope single-walled carbon nanotubes |
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