基于性能退化的电力电子器件寿命评估

针对目前的寿命评估方法不能满足高可靠、长寿命以及多故障模式竞争的电力电子器件寿命评估需求，提出了基于性能退化的电力电子器件寿命评估方法。通过收集电力电子器件的性能退化数据，建立其性能退化模型和寿命分布模型，给出性能退化模型和寿命分布模型的模型参数估计、模型拟合优度检验以及模型优选方法。考虑到电力电子器件具有多个性能参数的退化，提出电力电子器件竞争失效模型，实现对高可靠、长寿命以及多故障模式竞争的电力电子器件寿命快速评估。以某型绝缘栅双极型晶体管为例开展寿命评估，评估结果和试验结果差距较小，验证了该方法具有良好的准确性和有效性。

Performance Degradation Based Lifetime Evaluation of Power Electronic Devices

Current lifetime evaluation methods are often ineffective for power electronic devices which have high reliability, long life, and multi-fault mode competition. Accordingly, a lifetime evaluation method based on performance degradation data is proposed. Such data is used to construct performance degradation and lifetime distribution models. Then, the model parameter estimation, model goodness-of-fit checking, and model optimization methods are derived. By considering the trends in the degradation of multiple performance parameters, a competitive failure model is constructed to achieve a fast evaluation for the lifetime of power electronic devices with high reliability, long life, and multi-fault mode competition. As an example, lifetime evaluation is carried out for an insulated gate bipolar transistor. The difference between the evaluation results and measured test results is small, which verifies that the proposed method is quite accurate and effective.