电子束辐照对多壁碳纳米管的影响（英文）

在室温下采用透射电子显微镜中汇聚的电子束辐照多壁碳纳米管。结果表明,在能量为100 keV的电子束辐照下除了碳纳米管管壁有一些弯曲外没有其他结构被破坏;当电子能量增加到200 keV时,纳米管有明显的损伤,可以观察到纳米管的无定型化、纳米管外壁的凹坑和缺口。200 keV的电子束辐照还能形成碳洋葱和2根多壁纳米管的焊接。多壁碳纳米管的离位阀能为83~110 keV。能量超过阀能的电子束可以很轻易地损伤纳米管而低于阀能的电子束则很难损坏纳米管,其损伤机理为溅射和原子离位。

Effect of electron beam irradiation on multi-walled carbon nanotubes

Multi-walled carbon nanotubes （MWCNTs） were irradiated with focused electron beams in a transmission electron microscope at room temperature. The results showed that carbon nanotubes had no obvious structural damages but only shell bending under 100 keV electron beam irradiation. However, when the electron energy increased to 200 keV, the nanotubes were damaged and amorphization, pits and gaps were detected. Furthermore, generating of carbon onions and welding between two MWCNTs occurred under 200 keV electron irradiation. It was easy to destroy the MWCNTs as the electron beams exceeded the displacement threshold energy that was calculated to be 83-110 keV. Conversely, the energy of electron beams below the threshold energy was not able to damage the tubes. The damage mechanism is sputtering and atom displacement.