| 集成电路测试系统及其开发利用 |
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| 引用本文： | 王宇虹,张敏.集成电路测试系统及其开发利用[J].油气井测试,2006,15(4):68-70. |
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| 作者姓名： | 王宇虹 张敏 |
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| 作者单位： | 大庆石油管理局钻探集团测井公司,黑龙江,大庆,163412 |
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| 摘 要： | 介绍了集成电路测试系统的结构、组成、功能,并以单运放OP07A为例,介绍其高温测试的正确方法,通过对照参数找异常、修改测试程序并编译,重新运行生成新文件,完成对新器件测试程序的开发.
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| 关 键 词： | 集成电路 测试系统 测试仪器 开发 |
| 收稿时间： | 2006-03-31 |
| 修稿时间： | 2006-03-31 |
Testing System of Integrate Circuit and Its Exploitation and Use |
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| Wang Yuhong,Zhang Min.Testing System of Integrate Circuit and Its Exploitation and Use[J].Well Testing,2006,15(4):68-70. |
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| Authors: | Wang Yuhong Zhang Min |
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| Abstract: | The structure,makeup,function of testing system of integrate circuit are introduced and taking example of singe operation amplifier OPO7A,right method for high temperature testing is recommended.By contrasting parameter,finding abnormal point,amending testing program and translate and edit it,running to create the new apparatus and finish exploitation of testing program. |
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| Keywords: | integrate circuit testing system testing instrument exploration |
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