| 空间粒子辐射引起存储单元多位比特纠错方案 |
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| 引用本文： | 赵建超,于伦正.空间粒子辐射引起存储单元多位比特纠错方案[J].微机发展,2005,15(12):154-156. |
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| 作者姓名： | 赵建超 于伦正 |
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| 作者单位： | 航天时代电子公司771研究所 陕西西安710054 |
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| 摘 要： | 介绍了汉明码检/纠错的原理,并以IDT公司开发的具有检测两位错误和纠正一位错误的IDT49C465检/纠错电路单元为基础,针对主存储器某地址单元遭遇高能粒子轰击导致两位或多位比特出错的情况,提出了解决这类错误的一种方案。此方案通过利用阵列移位寄存器组对存储区数据进行转置来实现,并对此方案的数据可靠性做了概率分析。
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| 关 键 词： | 粒子辐射 汉明检/纠错 阵列移位寄存器组 |
| 文章编号： | 1005-3751（2005）12-0154-03 |
| 收稿时间： | 2005-03-20 |
| 修稿时间： | 2005年3月20日 |
A Solution of Errors- Correction in Memory Unit Caused by Space Particle Radiation |
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| ZHAO Jian-chao, YU Lun-zheng.A Solution of Errors- Correction in Memory Unit Caused by Space Particle Radiation[J].Microcomputer Development,2005,15(12):154-156. |
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| Authors: | ZHAO Jian-chao YU Lun-zheng |
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| Abstract: | Firstly introduces hamming code theory on detecting and correcting errors,then uses the implementation of IDT49C465 which is made by IDT corporation and capable of detecting two errors and correcting one error.Also puts up with a solution which is realized by memory unit data transpose with array shift-register group to the fact that certain address unit presents more than one bit errors because of high-flux bombardment.In addition,gives some statistical analysis on the security of the solution. |
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| Keywords: | particle radiation Hamming detecting and correcting error array shift-register group |
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