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Reliability assessment for particle-induced failures in multi-generation hard disk drives |
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| Authors: | Loon-Ching Tang Quock Y Ng Wee-Tat Cheong Jing-Shi Goh |
| Affiliation: | 1. Faculty of Engineering, Department of Industrial and Systems, National University of Singapore, 10 Kent Ridge Crescent, Singapore, 119260, Singapore 2. Seagate Technology International, 63 The Fleming, Science Park Drive, Singapore, 118249, Singapore |
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| 本文献已被 SpringerLink 等数据库收录！ | |
