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子孔径拼接干涉测量一大口径双曲面(英文)
引用本文:王孝坤,郑立功,张斌智,闫锋,张忠玉,张学军.子孔径拼接干涉测量一大口径双曲面(英文)[J].红外与激光工程,2009,38(1).
作者姓名:王孝坤  郑立功  张斌智  闫锋  张忠玉  张学军
作者单位:1. 中国科学院长春光学精密机械与物理研究所,中国科学院光学系统先进制造技术重点实验室,吉林,长春,130033
2. 中国科学院长春光学精密机械与物理研究所,中国科学院光学系统先进制造技术重点实验室,吉林,长春,130033;中国科学院研究生院,北京,100039
基金项目:中国科学院长春光学精密机械与物理研究所创新基金 
摘    要:为了无需辅助元件就能够实现对大口径非球面的检测,将子孔径拼接技术与干涉技术相结合,提出了一种利用子孔径拼接干涉检测非球面的新方法.分析了该技术的基本原理,并基于齐次坐标变换、最小二乘拟合建立了一种综合优化的拼接模型,在此基础上初步设计和搭建了子孔径拼接干涉检测装备.利用该方法对一口径为350 mm的双曲面进行了5个子孔径的拼接检测,得到拼接后的全口径面形误差的PV值为0.319λ,RMS值为0.044λ(=632.8 nm).为了对比和验证,对该非球面进行了零位补偿检测,两种方法测量所得的全口径面形分布是一致的,其PV值和RMS值的偏差分别为0.032λ和0.004λ.实验结果表明:该数学模型和拼接算法是准确可行的,从而提供了一种非零补偿测试大口径非球面的手段.

关 键 词:光学检测  子孔径拼接干涉  非球面  最小二乘拟合

Subaperture stitching interferometry for testing a large hyperboloid
WANG Xiao-kun,ZHENG Li-gong,ZHANG Bin-zhi,YAN Feng,ZHANG Zhong-yu,ZHANG Xue-jun.Subaperture stitching interferometry for testing a large hyperboloid[J].Infrared and Laser Engineering,2009,38(1).
Authors:WANG Xiao-kun  ZHENG Li-gong  ZHANG Bin-zhi  YAN Feng  ZHANG Zhong-yu  ZHANG Xue-jun
Affiliation:1.Key Laboratory of Optical System Advanced Manufacturing Technology;Changchun Institute of Optics;Fine Mechanics and Physics;Chinese Academy of Sciences;Changchun 130033;China;2.Graduate School of the Chinese Academy of Sciences;Beijing 100039;China
Abstract:In order to test large aspheric surfaces without the aid of null optics, a novel method called subaperture stitching interferometry (SSI) is presented. The synthetical optimization stitching model are established based on homogeneous oordinate's transform and simultaneous least-squares fitting. A prototype of testing large aspheres is developed by the stitching method. The experiment of testing a hyperboloid with SSI is carried out. The PV and RMS of the surface are 0.319λ and 0.044λ ( is 632.8 nm) respectively when five subapertures are stitched together. For comparison and validation, the asphere is also measured by null testing. It is shown that the two testing results consist with each other, PV and RMS error are 0.032λ and 0.004λ respectively. Thus, it can be concluded that the algorithm and model of the SSI technology are feasible for the testing of large aspheric surfaces, which provides the probability of testing the mirror with large aperture and asphericity in non-null configuration.
Keywords:Optical metrology  SSI  Aspheric surface  Least-squares fitting
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