Measurement of the modal reflectivity of an antireflection coating on a superluminescent diode |
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| Authors: | Kaminow I Eisenstein G Stulz L |
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| Affiliation: | Bell Laboratories, Holmdel, NJ, USA; |
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| Abstract: | A method for measuring the modal reflectivity of the antireflection coating applied to a laser diode is described and demonstrated. It is based on measurements of the Fabry-Perot modulation depth of the resulting superluminescent diode (SLD) output spectrum at the threshold current of the original laser. A modal reflectivity of less than2 times 10^{-4}has been obtained. |
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