| 基于边界扫描的BIST技术 |
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| 引用本文： | 王爱珍,吴晓晔,王石记.基于边界扫描的BIST技术[J].计算机测量与控制,2011,19(10). |
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| 作者姓名： | 王爱珍 吴晓晔 王石记 |
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| 作者单位： | 忻州师范学院,山西忻州034000;北京航天测控技术开发公司,北京 100041 |
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| 摘 要： | 近年来,随着信息化武器装备复杂度的增加和现场级快速测试诊断需求的增加,迫切需要基于边界扫描的BIST技术;在这种应用模式中,基于边界扫描的BIST技术能解决现场级快速测试诊断需求,测试结果仅需给出板卡是否有故障而不需要定位具体的故障,如果板卡有问题,将板卡送到基地采用基于边界扫描的ATE技术进行详细的故障定位和维修操作,即基于边界扫描的BIST技术解决故障检测问题,而基于边界扫描的ATE技术解决故障隔离问题;文章紧密联系应用需求,并以工程应用作为参考目标,从技术体系上研究基于边界扫描的BIST技术,并给出了边界扫描互连测试最优BIST架构。
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| 关 键 词： | 边界扫描 BIST 快速测试诊断 ATE |
BIST Technology Based on Boundary Scan |
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| Wang Aizhen,Wu Xiaoye,Wang Shiji.BIST Technology Based on Boundary Scan[J].Computer Measurement & Control,2011,19(10). |
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| Authors: | Wang Aizhen Wu Xiaoye Wang Shiji |
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| Affiliation: | Wang Aizhen,Wu Xiaoye,Wang Shiji(1.Xinzhou Teachers University,Xinzhou 034000,China,2.Beijing Aerospace Measurement & Control Corp,Beijing 100041,China) |
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| Abstract: | In recent years,with the complexity increment of informational weapon equipment and the demand increment of field level rapid test and diagnosis,BIST technology based on boundary scan is needed urgently.In this application mode,the field level rapid testing and diagnosis demand is resolved by the BIST technology based on the boundary scan.Whether the fault is on the board is only given in the testing result and the detail fault information is not needed.If some problem is on the board,the board will be sent... |
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| Keywords: | boundary scan BIST rapid test and diagnosis ATE |
| 本文献已被 CNKI 万方数据 等数据库收录！ |
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