| 基于单片机仿真器的单片机应用电路板故障测试系统的研究 |
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| 引用本文： | 覃战冰,邓斌.基于单片机仿真器的单片机应用电路板故障测试系统的研究[J].国外电子测量技术,2006,25(11):16-19. |
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| 作者姓名： | 覃战冰 邓斌 |
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| 作者单位： | 空军雷达学院,武汉,430019 |
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| 摘 要： | 对单片机应用电路板的故障测试进行研究,提出解决单片机应用电路板故障测试技术难题的解决方法,介绍测试系统的组成.根据文中提出的方法研制成功具有实用性的单片机应用电路板测试系统.
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| 关 键 词： | 单片机系统 测试系统 电路板故障测试 |
Study of fault testing system of singlechip application circuit board based on singlechip emluator |
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| Tan Zhanbing,Deng Bin.Study of fault testing system of singlechip application circuit board based on singlechip emluator[J].Foreign Electronic Measurement Technology,2006,25(11):16-19. |
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| Authors: | Tan Zhanbing Deng Bin |
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| Affiliation: | Air Fore Radar Academy, Wuhan 430019 |
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| Abstract: | The fault testing of singlechip application circuit board was studied. The solution of technical problem in the fault testing of singlechip application circuit board was proposed, and the composing of testing system was introduced in the paper. According to .this method, a practical fault testing system of singlechip application circuit board has been developed successfully. |
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| Keywords: | singlechip system testing system circuit board fault testing |
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