| 芯片级系统的在线测试技术 |
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| 引用本文： | 江建慧,员春欣.芯片级系统的在线测试技术[J].计算机研究与发展,2004,41(9):1593-1603. |
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| 作者姓名： | 江建慧 员春欣 |
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| 作者单位： | 同济大学计算机科学与技术系,上海,200092 |
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| 基金项目： | 国家自然科学基金项目 (90 2 0 70 2 1) |
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| 摘 要： | 在线测试是基本容错技术之一．把在线测试技术概括为差错控制码、重复与比较、在线监督等3类，对其发展历史进行了回顾，重点是20世纪90年代以来的成果，包括芯片设计方案、原型及产品．研究结果表明，在线测试技术已经融入了高性能处理机芯片的设计之中．
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| 关 键 词： | 在线测试 高性能处理机 容错计算 VLSI芯片 |
Online Testing Techniques for Chip-Level Systems |
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| JIANG Jian,Hui and YUAN Chun,Xin.Online Testing Techniques for Chip-Level Systems[J].Journal of Computer Research and Development,2004,41(9):1593-1603. |
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| Authors: | JIANG Jian Hui and YUAN Chun Xin |
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| Abstract: | Online testing is one of the fundamental fault tolerant techniques It is traced from three lines: error control codes, replication and comparison, and on line monitoring The development history and the achievements in 1990's , including chip design schemes, prototypes, and products, are emphasized The existing results show that the online testing techniques are now merged into the design of high performance processors |
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| Keywords: | online testing high performance processor fault-tolerant computing VLSI chip |
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