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运动电极法光学介质膜层的直接发射光谱分析—ZnSe膜层中Zn、Se原子比的测定
引用本文:谷松海.运动电极法光学介质膜层的直接发射光谱分析—ZnSe膜层中Zn、Se原子比的测定[J].光学精密工程,1989,0(2):54-55.
作者姓名:谷松海
摘    要:本文用滤纸吸附标准溶液制作标样,用发射光谱法对ZnSe膜层中Zn、Se原子比进行了测定。考察了测定条件,方法相对标准偏差为7.5%。


Emission Spectrum Analysis of the Proportion of Zn and Se in the Thin Film of ZnSe by Means of Movable Electrode
Gu Songhai.Emission Spectrum Analysis of the Proportion of Zn and Se in the Thin Film of ZnSe by Means of Movable Electrode[J].Optics and Precision Engineering,1989,0(2):54-55.
Authors:Gu Songhai
Abstract:In our experiments standard sample was made by filter paper absorbing the standard solution the proportion of Zn and Se in the thin film of ZnSe was measured by means of emission spectrum analysis The conditions of determination were discussed. The relative standard deviation of this method was 7.5%.
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