| X射线源透射式工业计算机断层扫描成像技术在复合材料工件检测中的散射修正 |
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| 引用本文： | 彭光含,蔡新华,乔闹生,刘长青,杨学恒.X射线源透射式工业计算机断层扫描成像技术在复合材料工件检测中的散射修正[J].无损检测,2007,29(4):181-184. |
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| 作者姓名： | 彭光含 蔡新华 乔闹生 刘长青 杨学恒 |
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| 作者单位： | 1. 湖南文理学院,物电系,常德,415000
2. 重庆大学,数理学院,重庆,400044 |
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| 基金项目： | 湖南省社会科学基金;湖南省重点建设学科--光学基金 |
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| 摘 要： | 在X射线源透射式工业计算机断层扫描成像技术（X-TICT）中，X射线透射物质时，发生了Compton光子散射现象，有用信息连同散射光子一起进入探头形成伪影。因此，必须进行散射修正。利用X射线透射物质时X光子散射遵循的Compton散射强度方程，结合X射线与物质相互作用的特性，建立了有效去除X—TICT在复合材料工件检测中光子散射问题造成的图像伪影的散射修正模型。探头的总计数减去散射光子数，即可有效去除X-TICT在复合材料工件检测中散射光子造成的伪影。
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| 关 键 词： | 工业计算机断层扫描成像技术 散射修正 X射线 复合材料 |
| 文章编号： | 1000-6656（2007）04-0181-04 |
| 收稿时间： | 2005-11-29 |
| 修稿时间： | 2005-11-29 |
Scattering Correction for X-ray TICT in Testing Composites Workpiece |
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| PENG Guang-han,CAI Xin-hua,QIAO Nao-sheng,LIU Chang-qing,YANG Xue-heng.Scattering Correction for X-ray TICT in Testing Composites Workpiece[J].Nondestructive Testing,2007,29(4):181-184. |
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| Authors: | PENG Guang-han CAI Xin-hua QIAO Nao-sheng LIU Chang-qing YANG Xue-heng |
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| Affiliation: | 1.Department of Physics and Electronic, Hunan University of Arts and Science, Changde 415000, China;2.College of Science, Chongqing University, Chongqing 400044, China |
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| Abstract: | In the case of a polychromatic source in X-ray TICT, the phenomenon of Compton photon scattering in material takes place. Scattering photon with useful message getting into detectors leads to false image. The precise accurate models equation of scattering correction about interal composites workpiece in X-ray TICT from Compton scattering intensity equation is deduced for wiping out the false image efficiently, which results from photon scattering. By subtracting the count of scattering photon from the one of each detector, it can wipe off the false image for scattering photon effectively for X-ray TICT in testing composites workpiece. |
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| Keywords: | ICT Scattering correction X-ray Composites |
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