| CEMS AND COUPLING EFFECT OF INTERLAYERS IN MULTILAYERED FeSi/Si AMORPHOUS FILMS |
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| 作者姓名： | 马小丁 刘宜华 梅良模 |
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| 作者单位： | Shandong University，Jinan 250100，China |
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| 基金项目： | The Project Supported by National Natural Science Foundation of China |
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| 摘 要： | Multilayered FeSi/Si amorphous films with fixed FeSi layer thickness and different Si layer thicknesses have been studied by conversion electron Mossbauer spectroscopy at room temperature. The results showed that with decreasing the Si layer thickness, the hyperfine field of samples increased and the thickness of interface dead layers arisen from the atomic interdiffusion effect decreased. These are due to the coupling effect between the magnetic layers. When the Si layers are thinner than 0.88 nm, the direction of the magnetization is out of the film plane.
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CEMS AND COUPLING EFFECT OF INTERLAYERS IN MULTILAYERED FeSi/Si AMORPHOUS FILMS |
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| Ma Xiaoding Liu Yihua Mei Liangmo.CEMS AND COUPLING EFFECT OF INTERLAYERS IN MULTILAYERED FeSi/Si AMORPHOUS FILMS[J].Nuclear Science and Techniques,1992(2). |
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| Authors: | Ma Xiaoding Liu Yihua Mei Liangmo |
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| Abstract: | Multilayered FeSi/Si amorphous films with fixed FeSi layer thickness and different Si layer thicknesses have been studied by conversion electron Mossbauer spectroscopy at room temperature. The results showed that with decreasing the Si layer thickness, the hyperfine field of samples increased and the thickness of interface dead layers arisen from the atomic interdiffusion effect decreased. These are due to the coupling effect between the magnetic layers. When the Si layers are thinner than 0.88 nm, the direction of the magnetization is out of the film plane. |
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| Keywords: | Multilayered films Dead layers Coupling between the magnetic layers Conversion electron Mossbauer spectroscopy |
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