| 表面性质对扫描力显微术成像的影响 |
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| 引用本文： | 汤鸣,何会新,蔡生民,刘忠范.表面性质对扫描力显微术成像的影响[J].电子显微学报,1999,18(1):111-114. |
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| 作者姓名： | 汤鸣 何会新 蔡生民 刘忠范 |
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| 作者单位： | 1. 北京大学化学与分子工程学院,北京,100871
2. Institute of Materials Research & Engineering,National University of Singapore,Singapore 119260 |
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| 基金项目： | 国家攀登计划,杰出人才基金 |
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| 摘 要： | 利用微接触印刷的方法制备了图形化的自组装膜，考察了膜的表面性质对接触式原子力显微镜（ＡＦＭ），摩擦力显微镜（ＦＦＭ）和剪切力显微镜（ＳＦＭ）的成像的影响。发现ＡＦＭ能反映样品的表面形貌，而ＦＦＭ和ＳＦＭ的以表面性质的影响较大，在表面性质差别很大的图形表面上会出现图像衬底与表面形貌反转的现象。
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| 关 键 词： | 扫描力显微镜 原子力显微镜 摩擦力显微镜 剪切力显微镜 图形化表面 |
Investigating scanning force microscopy contrast using chemically distinct patterns |
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| TANG Ming,HE Hui-xin,CAI Sheng-min,LIU Zhong-fan.Investigating scanning force microscopy contrast using chemically distinct patterns[J].Journal of Chinese Electron Microscopy Society,1999,18(1):111-114. |
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| Authors: | TANG Ming HE Hui-xin CAI Sheng-min LIU Zhong-fan |
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| Abstract: | Chemically distinct patterned surfaces have been fabricated through microcontact printing technique.Contact mode atomic force microscope (AFM),friction force microscope (FFM),and shear force microscope (SFM) were used to map the patterns.AFM images were correlated well with the surface topography. However, FFM and SFM contrast were inverted with respect to the topography,indicating the strong influence of surface property on FFM and SFM imaging.The mechanism of the contrast inversion has been discussed. |
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| Keywords: | scanning force microscope atomic force microscope friction force microscope shear force microscope patterned surface |
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