| 杂散电容对交流法微电容测量电路噪声特性影响的分析 |
| |
| 引用本文： | 薛鹏,彭黎辉.杂散电容对交流法微电容测量电路噪声特性影响的分析[J].仪器仪表学报,2011,32(2). |
| |
| 作者姓名： | 薛鹏 彭黎辉 |
| |
| 作者单位： | 清华大学自动化系,北京,100084 |
| |
| 摘 要： | 对电容成像交流法微电容测量电路由杂散电容导致的测量噪声进行了研究.利用运算放大器的噪声模型,对运算放大器输入电压噪声、输人电流噪声以及周边电阻元件的热噪声通过杂散电容作用于交流法微电容测量电路输出的影响进行了理论分析,给出了测量电路输出中噪声峰峰值的理论计算公式并进行了实验验证.理论分析及实验结果表明:交流法微电容测量电路前级运算放大器输入电压噪声通过测量端与地之间的杂散电容形成的噪声是该微电容测量电路输出噪声的主要来源.最后给出了电容成像系统前级运算放大器选型的指导原则.
|
| 关 键 词： | 电容成像 杂散电容 噪声 |
Analysis of the effect of stray capacitance on noise characteristics of AC-based capacitance measurement circuit |
| |
| Xue Peng,Peng Lihui.Analysis of the effect of stray capacitance on noise characteristics of AC-based capacitance measurement circuit[J].Chinese Journal of Scientific Instrument,2011,32(2). |
| |
| Authors: | Xue Peng Peng Lihui |
| |
| Affiliation: | Xue Peng,Peng Lihui(Department of Automation,Tsinghua University,Beijing 100084,China) |
| |
| Abstract: | The noise induced by stray capacitance in an AC-based capacitance measurement circuit for tomography application is studied.Using the noise model of Op-AMP,the effects of voltage noise,current noise and resistance noise on the output of AC-based capacitance measurement circuit are analyzed.A calculation formula for the estimation of peak to peak noise value of AC-based capacitance measurement circuit is presented and verified through experiments.Theoretical analysis and experimental result both demonstrate ... |
| |
| Keywords: | electrical capacitance tomography stray capacitance noise |
| 本文献已被 CNKI 万方数据 等数据库收录！ |
|
