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Characterization of the diffraction properties of quantum-dot-array diffraction grating
Authors:Wang Chuanke  Kuang Longyu  Wang Zhebin  Liu Shenye  Ding Yongkun  Cao Leifeng  Foerster Eckhart  Wang Deqiang  Xie Changqing  Ye Tianchun
Affiliation:National Key Laboratory of Laser Fusion, Research Center of Laser Fusion, China Academy of Engineering Physics, P.O. Box 919-986, Mianyang, Sichuan 621900, People's Republic of China. wck810818@126.com
Abstract:A new dispersive element named as quantum-dot-array diffraction grating L. F. Cao, China patent No. 200410081499 (August 10, 2004)] for visible light has been developed and characterized experimentally. A large number of quantum dots distributed on a substrate as sinusoidal function can be used to diffract x rays without higher-order diffraction. The experimental patterns show that the higher-order diffractions which inevitably exist in the spectrum recorded using traditional diffraction gratings can be eliminated effectively by this newly designed element. It indicates that quantum-dot-array diffraction grating could be an attractive alternative of presently used diffraction grating in soft x-ray spectroscopy application to get rid of the higher-order diffraction distortions.
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