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Coplanar Waveguide Using Ferroelectric Thin Oxide Film: Dielectric Constant
Authors:W J Kim  S S Kim  T K Song  S E Moon  E K Kim  S J Lee  S K Han  M H Kwak  H Y Kim  Y T Kim  H C Ryu  C S Kim  K Y Hang
Affiliation:(1) Changwon National University, Sarim-Dong 9, Changwon, Korea;(2) Basic Research Laboratory, Electronics and Telecommunications Research Institute, Gajeong-Dong 161, Taejon, Korea
Abstract:Coplanar waveguide (CPW) transmission lines were fabricated on thin ferroelectric Ba1 – xSrxTiO3 films for tunable microwave applications. The growth of the ferroelectric oxide films was accomplished by a pulsed laser deposition with a partial oxygen background. Microwave properties of the CPW phase shifter were measured using a HP 8510C vector network analyzer from 0.045–20 GHz with –40–40 V of dc bias. A large phase shift angle of sim 120compfn at 10 GHz was observed from the CPW (gap = 4mgrm, length = 3 mm) with a 40 V of dc bias change. The dielectric constant of the thin ferroelectric film was extracted from the dimension of the CPW (gap, width, length) and the measured S-parameter by a modified conformal mapping. However, the dielectric constant of the ferroelectric thin film exhibits a gap dependency; dielectric constant (990–830) decreases with increasing gap size (4–19 mgrm, respectively). By adjusting the filling factors of the film, a lsquoconstantrsquo dielectric constant of BST film is found to be 810 ± 5.
Keywords:(Ba  Sr)TiO3  thin film  ferroelectric  conformal mapping  phase shifter  microwave
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