Dependence of the mechanism of current flow in the in-<Emphasis Type="Italic">n</Emphasis>-GaN alloyed ohmic contact on the majority carrier concentration |
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Authors: | V N Bessolov T V Blank Yu A Goldberg O V Konstantinov E A Posse |
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Affiliation: | (1) Ioffe Physicotechnical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, St. Petersburg, 194021, Russia |
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Abstract: | Based on the study of the temperature dependence of resistance of the In-n-GaN alloyed ohmic contacts, it is found that the mechanism of current flow in them substantially depends on the concentration N of uncompensated donors in GaN. At N = 5 × 1016 ? 1 × 1018 cm?3, current mainly flows along the metallic shunts, and at N ? 8 × 1018 cm?3 it flows by tunneling. |
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